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A comprehensive model for hot carrier degradation in LDMOS transistors
Publication:
A comprehensive model for hot carrier degradation in LDMOS transistors
Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, P.
;
Mertens, Jan
;
Bauwens, F.
;
Joris, P.
;
De Ceuninck, Ward
;
Tack, M.
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1917
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1917
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-08
Citations