Publication:

A comprehensive model for hot carrier degradation in LDMOS transistors

Date

2007
Proceedings Paper
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dc.contributor.authorMoens, P.
dc.contributor.authorMertens, Jan
dc.contributor.authorBauwens, F.
dc.contributor.authorJoris, P.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorTack, M.
dc.contributor.imecauthorMertens, Jan
dc.contributor.imecauthorDe Ceuninck, Ward
dc.date.accessioned2021-10-16T18:00:01Z
dc.date.available2021-10-16T18:00:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12585
dc.source.beginpage492
dc.source.conferenceProceedings 45th Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate15/04/2007
dc.source.conferencelocationPhoenix, AZ USA
dc.source.endpage497
dc.title

A comprehensive model for hot carrier degradation in LDMOS transistors

dc.typeProceedings paper
dspace.entity.typePublication
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