Browsing by Author "Bayer, Armin"
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Publication Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range
Journal article2009, Review of Scientific Instruments, (80) 9, p.93102Publication Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam
Proceedings paper2009, European Optics & Optoelectronics Symposium, 20/04/2009