Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam

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Author(s)

Malinowski, Pawel

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Germain, Marianne

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Barkusky, Frank

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Duboz, Jean-Yves

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Semond, Fabrice

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Hochedez, Jean-Francois

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Giordanengo, Boris

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Borghs, Gustaaf

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Mertens, Robert

Metrics

1982 since deposited on 2021-10-18

Acq. date: 2025-10-23