Publication:

Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam

Date

2009
Proceedings Paper
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Author(s)

Malinowski, Pawel  
;
John, Joachim  
;
Lorenz, Anne
;
Cheng, Kai
;
Derluyn, Joff
;
Germain, Marianne
;
De Moor, Piet  
;
Minoglou, Kiki
;
Barkusky, Frank
;
Bayer, Armin
;
Mann, Klaus
;
Duboz, Jean-Yves
;
Semond, Fabrice
;
Hochedez, Jean-Francois
;
Giordanengo, Boris
;
Borghs, Gustaaf  
;
Mertens, Robert  

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1986 since deposited on 2021-10-18
1last month
Acq. date: 2025-12-10

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