Browsing by Author "Bayerl, Albin"

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Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Wu, Qian
;
Porti, Marc
;
Bayerl, Albin
;
Martin-Martinez, Javier
;
Rodriguez, Rosana
Journal article
2015, Journal of Vacuum Science and Technology B, (33) 2, p.22202
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors

Bayerl, Albin
;
Lanza, Mario
;
Aguilera, Lidia
;
Porti, Marc
;
Nafria, Montserrat
;
Aymerich, Xavier
Journal article
2013, Microelectronics Reliability, (53) 6, p.867-871