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Browsing by Author "Benkhelifa, Mahdi"

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    Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM

    Diaz Fortuny, Javier  
    ;
    Benkhelifa, Mahdi
    ;
    Grill, Alexander  
    ;
    Bury, Erik  
    ;
    Degraeve, Robin  
    Proceedings paper
    2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30

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