Browsing by Author "Bennett, N.S."
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Publication B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages
Journal article2016, Microelectronics Reliability, 59, p.108-116Publication Development of B-spline x-ray diffraction imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips
Proceedings paper2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.1517-1522Publication On the activation mechanisms of sub-melt laser anneals
Meeting abstract2008, E-MRS Sprng Meeting Symposium I: Front-End Junction and Contact Formation in Future Silicon/Germanium Based Devices, 26/05/2008Publication On the analysis of the activation mechanisms of sub-melt laser anneals
Journal article2008, Materials Science and Engineering B, 154-155, p.24-30