Browsing by Author "Bernardini, S."
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Publication Effect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures
Journal article2004, Microelectronic Engineering, (72) 1_4, p.90-95Publication Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate
;Volkos, S.N. ;Bernardini, S. ;Rigopoulos, N. ;Efthymiou, E.S. ;Hawkins, I.D.Hamilton, B.Journal article2007, Microelectronic Engineering, (84) 9_10, p.2374-2377Publication Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
;Bernardini, S. ;Ishii, M. ;Whittaker, E. ;Hamilton, B. ;Freeland, C.Poolton, N.R.J.Journal article2007, Microelectronic Engineering, (84) 9_10, p.2286-2289Publication Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
Journal article2004, Applied Physics Letters, (84) 21, p.4251-4253