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Browsing by Author "Bernardini, S."

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    Effect of fixed dielectric charges on tunnelling transparency in MIM and MIS structures

    Bernardini, S.
    ;
    Masson, P.
    ;
    Houssa, Michel  
    Journal article
    2004, Microelectronic Engineering, (72) 1_4, p.90-95
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    Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate

    Volkos, S.N.
    ;
    Bernardini, S.
    ;
    Rigopoulos, N.
    ;
    Efthymiou, E.S.
    ;
    Hawkins, I.D.
    ;
    Hamilton, B.
    Journal article
    2007, Microelectronic Engineering, (84) 9_10, p.2374-2377
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    Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon

    Bernardini, S.
    ;
    Ishii, M.
    ;
    Whittaker, E.
    ;
    Hamilton, B.
    ;
    Freeland, C.
    ;
    Poolton, N.R.J.
    Journal article
    2007, Microelectronic Engineering, (84) 9_10, p.2286-2289
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    Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide

    Bernardini, S.
    ;
    Masson, P.
    ;
    Houssa, Michel  
    ;
    Lalande, F.
    Journal article
    2004, Applied Physics Letters, (84) 21, p.4251-4253

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