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Browsing by Author "Bhoir, Mandar"

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    Effect of sub-10nm fin-widths on the analog performance of FinFETs

    Bhoir, Mandar
    ;
    Nihar, Mohapatra
    ;
    Chiarella, Thomas  
    ;
    Ragnarsson, Lars-Ake  
    ;
    Mitard, Jerome  
    Proceedings paper
    2019, EDTM 2019 Electron Devices Technology and Manufacturing Conference, 13/03/2019, p.7-9
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    Vt extraction methodologies influence process induced Vt variability: Does this fact still hold for advanced technology nodes?

    Bhoir, Mandar
    ;
    Chiarella, Thomas  
    ;
    Mitard, Jerome  
    ;
    Horiguchi, Naoto  
    ;
    Mohapatra, Nihar
    Journal article
    2020, IEEE Transactions on Electron Devices, (67) 11, p.4691-4695

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