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Vt extraction methodologies influence process induced Vt variability: Does this fact still hold for advanced technology nodes?
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Vt extraction methodologies influence process induced Vt variability: Does this fact still hold for advanced technology nodes?
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bhoir, Mandar
;
Chiarella, Thomas
;
Mitard, Jerome
;
Horiguchi, Naoto
;
Mohapatra, Nihar
Journal
IEEE Transactions on Electron Devices
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1889
since deposited on 2021-10-28
1
last month
Acq. date: 2025-12-16
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Metrics
Views
1889
since deposited on 2021-10-28
1
last month
Acq. date: 2025-12-16
Citations