Browsing by Author "Bi, J."
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Publication Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 5/12/2016, p.778-781Publication Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM