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Browsing by Author "Blanck, H."

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    Publication

    Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology

    Petersen, R.
    ;
    De Ceuninck, Ward  
    ;
    D'Haen, Jan  
    ;
    D'Olieslaeger, Marc  
    ;
    De Schepper, Luc
    ;
    Vendier, O.
    Journal article
    2002, Microelectronics Reliability, (42) 9_11, p.1359-1363

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