Browsing by Author "Boedt, F."
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Publication Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Proceedings paper2009, IEEE International SOI Conference, 5/10/2009Publication Reliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates
Proceedings paper2010, International SOI Conference, 11/10/2010, p.129-130