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Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Publication:
Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Aoulaiche, Marc
;
Rakowski, Michal
;
De Wachter, Bart
;
Bourdelle, K.
;
Nguyen, B.-Y.
;
Boedt, F.
;
Delprat, D.
;
Jurczak, Gosia
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1885
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1885
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations