Browsing by Author "Bolognesi, D."
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Publication A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors
Proceedings paper2003, 15th International Symposium on Power Semiconductor Devices & ICs - ISPSD, 14/04/2003, p.88-91Publication Cost effective implementation of a 90 V RESURF P-type drain extended MOS in a 0.35 μm based smart power technology
Proceedings paper2002, ESSDERC - 32nd European Solid-State Device Research Conference, 24/09/2002, p.291-294Publication Future trends in intelligent interface technologies for 42V battery automotive applications