Browsing by Author "Bonaldo, S."
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Publication Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Journal article2019, Applied Physics Letters, (114) 20, p.203501Publication Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
;Gorchichko, Maria ;Zhang, E.X. ;Wang, P. ;Schrimpf, R. ;Reed, R. ;Fleetwood, D.M.Bonaldo, S.Proceedings paper2020, Nuclear & Space Radiation Effects Conference - NSREC, 20/07/2020, p.C-4