Publication:

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Date

2019
Journal article
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Author(s)

Fleetwood, Dan
;
Beyne, Sofie  
;
jiang, Rong
;
Zhao, S. E.
;
Whang, P.
;
Bonaldo, S.
;
McCurdy, M. W.
;
Tokei, Zsolt  
;
De Wolf, Ingrid  
;
Croes, Kristof  
;
Zhang, E. X.
;
Alles, M. S.
;
Schrimpf, Ronald
;
Reed, Robert
;
Linten, Dimitri  

Journal

Applied Physics Letters

Abstract

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1944 since deposited on 2021-10-27
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Acq. date: 2026-01-26

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1944 since deposited on 2021-10-27
1last month
Acq. date: 2026-01-26

Citations