Publication:

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Date

2019
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorFleetwood, Dan
dc.contributor.authorBeyne, Sofie
dc.contributor.authorjiang, Rong
dc.contributor.authorZhao, S. E.
dc.contributor.authorWhang, P.
dc.contributor.authorBonaldo, S.
dc.contributor.authorMcCurdy, M. W.
dc.contributor.authorTokei, Zsolt
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorCroes, Kristof
dc.contributor.authorZhang, E. X.
dc.contributor.authorAlles, M. S.
dc.contributor.authorSchrimpf, Ronald
dc.contributor.authorReed, Robert
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorBeyne, Sofie
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-27T09:15:08Z
dc.date.available2021-10-27T09:15:08Z
dc.date.issued2019
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32968
dc.identifier.urlhttps://doi.org/10.1063/1.5093549
dc.source.beginpage203501
dc.source.issue20
dc.source.journalApplied Physics Letters
dc.source.volume114
dc.title

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles