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Browsing by Author "Bourdelle, K."

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    Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates

    Collaert, Nadine  
    ;
    Aoulaiche, Marc
    ;
    Rakowski, Michal  
    ;
    De Wachter, Bart  
    ;
    Bourdelle, K.
    Proceedings paper
    2009, IEEE International SOI Conference, 5/10/2009

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