Browsing by Author "Buchegger, Peter"
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Publication Impact of Fin height variations on SRAM yield
Proceedings paper2012-04, International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA, 23/04/2012, p.1-2Publication Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
Oral presentation2011, 1st TRAMS Workshop