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Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
Publication:
Variability assessment of 13nm bulk-planar vs fully depleted FinFET SRAM
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zuber, Paul
;
Buchegger, Peter
;
Dobrovolny, Petr
;
Miranda Corbalan, Miguel
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1918
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Views
1918
since deposited on 2021-10-19
1
last month
1
last week
Acq. date: 2026-02-24
Citations