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Browsing by Author "Buffolo, M."

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    Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

    Modolo, N.
    ;
    Fregolent, M.
    ;
    Masin, F.
    ;
    Benato, A.
    ;
    Bettini, A.
    ;
    Buffolo, M.
    ;
    De Santi, C.
    ;
    Borga, Matteo  
    Journal article
    2022, MICROELECTRONICS RELIABILITY, (138) November, p.Art. 120560B

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