Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Modolo, N.; Fregolent, M.; Masin, F.; Benato, A.; Bettini, A.; Buffolo, M.; De Santi, C.; Borga, Matteo; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Vogrig, D.; Neviani, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M.

doi:10.1016/j.microrel.2022.114708

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Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

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2022

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https://doi.org/10.1016/j.microrel.2022.114708

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MICROELECTRONICS RELIABILITY

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1322 since deposited on 2023-01-09

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Acq. date: 2026-02-26

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

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