Publication:

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Date

2022
Journal article
https://doi.org/10.1016/j.microrel.2022.114708
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Author(s)

Modolo, N.
;
Fregolent, M.
;
Masin, F.
;
Benato, A.
;
Bettini, A.
;
Buffolo, M.
;
De Santi, C.
;
Borga, Matteo  
;
Posthuma, Niels  
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  
;
Vogrig, D.
;
Neviani, A.
;
Meneghesso, G.
;
Zanoni, E.
;
Meneghini, M.

Journal

MICROELECTRONICS RELIABILITY

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1316 since deposited on 2023-01-09
Acq. date: 2025-10-23

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1316 since deposited on 2023-01-09
Acq. date: 2025-10-23

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