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Browsing by Author "Bukhori, M.F."

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    Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

    Franco, Jacopo  
    ;
    Kaczer, Ben  
    ;
    Toledano Luque, Maria
    ;
    Roussel, Philippe  
    ;
    Mitard, Jerome  
    Proceedings paper
    2012, International Reliability Physics Symposium - IRPS, 15/04/2012, p.5A-4

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