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Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
Publication:
Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Kaczer, Ben
;
Toledano Luque, Maria
;
Roussel, Philippe
;
Mitard, Jerome
;
Ragnarsson, Lars-Ake
;
Witters, Liesbeth
;
Chiarella, Thomas
;
Togo, Mitsuhiro
;
Horiguchi, Naoto
;
Groeseneken, Guido
;
Bukhori, M.F.
;
Grasser, T.
;
Asenov, A.
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since deposited on 2021-10-20
Acq. date: 2025-10-23
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1905
since deposited on 2021-10-20
Acq. date: 2025-10-23
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Downloads
1
since deposited on 2021-10-20
Acq. date: 2025-10-23
Views
1905
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations