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Browsing by Author "Bukhori, Muhammad Faiz"

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    Impact of individual charged gate oxide defects on the entire ID-VG characteristic of nanoscaled FETs

    Franco, Jacopo  
    ;
    Kaczer, Ben  
    ;
    Toledano Luque, Maria
    ;
    Bukhori, Muhammad Faiz
    ;
    Roussel, Philippe  
    Journal article
    2012, IEEE Electron Device Letters, (33) 6, p.779-781

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