Browsing by Author "Burton, D."
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Publication Dependence of energy distributions of interface states on stress conditions
; ; Publication Electron trap generation at different temperatures in the gate oxide
Oral presentation2002, 33rd IEEE Semiconductor Interface Specialists Conference - SISCPublication On the interface states generated under different stress conditions
; ; Publication On the mechanism of electron trap generation in gate oxides
Journal article2001, Microelectronic Engineering, (59) 1_4, p.89-94Publication Properties of electron traps generated in the gate oxide
Oral presentation2001, SISC-Conference; December 2001; Washington, D.C.Publication Two types of electron traps generated in the gate silicon dioxide
Journal article2002, IEEE Trans. Electron Devices, (49) 11, p.1868-1875