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Properties of electron traps generated in the gate oxide
Publication:
Properties of electron traps generated in the gate oxide
Date
2001
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Zhang, Jenny
;
Lalor, M.
;
Burton, D.
;
Groeseneken, Guido
;
Degraeve, Robin
Journal
Abstract
Description
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Views
1995
since deposited on 2021-10-14
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1995
since deposited on 2021-10-14
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations