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Browsing by Author "Cabruja, E."

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    Publication

    Test structures for MCM-D technology characterization

    Lozano, M.
    ;
    Santander, J.
    ;
    Cabruja, E.
    ;
    Perello, Carles
    ;
    Ullan, M.
    ;
    Lora-Tamayo, E.
    ;
    Doyle, R.
    Journal article
    1999, IEEE Trans. Semiconductor Manufacturing, (12) 2, p.184-192

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