Browsing by Author "Cabruja, E."
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Publication Test structures for MCM-D technology characterization
;Lozano, M. ;Santander, J. ;Cabruja, E. ;Perello, Carles ;Ullan, M. ;Lora-Tamayo, E.Doyle, R.Journal article1999, IEEE Trans. Semiconductor Manufacturing, (12) 2, p.184-192