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Browsing by Author "Cacharelis, Philippe"

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    Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests

    Vermeulen, Tom
    ;
    Yao, Thierry
    ;
    Lowe, Antony
    ;
    Cacharelis, Philippe
    ;
    Degraeve, Robin  
    ;
    Van Houdt, Jan  
    Proceedings paper
    2004-09, Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC, 21/09/2004, p.269-272

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