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Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests
Publication:
Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests
Date
2004-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vermeulen, Tom
;
Yao, Thierry
;
Lowe, Antony
;
Cacharelis, Philippe
;
Degraeve, Robin
;
Van Houdt, Jan
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1993
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1993
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations