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Browsing by Author "Caillat, Chirstian"

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    Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

    Simoen, Eddy  
    ;
    Federico, Antonio
    ;
    Aoulaiche, Marc
    ;
    Ritzenthaler, Romain  
    ;
    Schram, Tom  
    Journal article
    2014, Semiconductor Science and Technology, (29) 11, p.115015

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