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Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Publication:
Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Date
2014
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Federico, Antonio
;
Aoulaiche, Marc
;
Ritzenthaler, Romain
;
Schram, Tom
;
Arimura, Hiroaki
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Groeseneken, Guido
;
Horiguchi, Naoto
;
Thean, Aaron
;
Crupi, Felice
;
Spessot, Alessio
;
Caillat, Chirstian
;
Fazan, Pierre
;
Na, Hoon Joo
;
Son, Yunik
;
Noh, Kyung Bong
Journal
Semiconductor Science and Technology
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1971
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
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Views
1971
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations