Browsing by Author "Cardoso Medeiros, Guilherme"
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Publication Device-aware test: A new test approach towards DPPB
Proceedings paper2019-11, IEEE International Test Conference (ITC) 2019, 12/11/2019, p.1-10Publication Pinhole defect characterization and modeling for STT-MRAM testing
Proceedings paper2019-05, IEEE European Test Symposium (ETS) 2019, 27/05/2019, p.1-6