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Conference contributions
Pinhole defect characterization and modeling for STT-MRAM testing
Publication:
Pinhole defect characterization and modeling for STT-MRAM testing
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Date
2019-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Rao, Siddharth
;
Cardoso Medeiros, Guilherme
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan
;
Yasin, Farrukh
;
Couet, Sebastien
;
Hamdioui, Said
;
Kar, Gouri Sankar
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1919
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Acq. date: 2025-12-12
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Views
1919
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-12
Citations