Publication:

Pinhole defect characterization and modeling for STT-MRAM testing

Date

2019-05
Proceedings Paper
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dc.contributor.authorWu, Lizhou
dc.contributor.authorRao, Siddharth
dc.contributor.authorCardoso Medeiros, Guilherme
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorYasin, Farrukh
dc.contributor.authorCouet, Sebastien
dc.contributor.authorHamdioui, Said
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.date.accessioned2021-10-27T23:42:21Z
dc.date.available2021-10-27T23:42:21Z
dc.date.issued2019-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34457
dc.source.beginpage1
dc.source.conferenceIEEE European Test Symposium (ETS) 2019
dc.source.conferencedate27/05/2019
dc.source.conferencelocationBaden-Baden Germany
dc.source.endpage6
dc.title

Pinhole defect characterization and modeling for STT-MRAM testing

dc.typeProceedings paper
dspace.entity.typePublication
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