Browsing by Author "Cartier, Ed"
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Publication Characterization of charge trapping in SiO2/HfO2 dielectrics
Proceedings paper2003, Proceedings International Semiconductor Device Research Symposium, 10/12/2003, p.322-323Publication Effect of bulk trap density on HfO2 reliability and yield
Proceedings paper2003-12, Technical Digest IEDM - IEEE International Electron Devices Meeting, 8/12/2003, p.935-938Publication Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
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