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Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Publication:
Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Date
2004-05
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pantisano, Luigi
;
Lucci, L.
;
Cartier, Ed
;
Kerber, Andreas
;
Groeseneken, Guido
;
Green, M.
;
Selmi, L.
Journal
IEEE Electron Device Letters
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1969
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1969
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations