Publication:
Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Date
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Lucci, L. | |
| dc.contributor.author | Cartier, Ed | |
| dc.contributor.author | Kerber, Andreas | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Green, M. | |
| dc.contributor.author | Selmi, L. | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-15T15:17:07Z | |
| dc.date.available | 2021-10-15T15:17:07Z | |
| dc.date.issued | 2004-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9389 | |
| dc.source.beginpage | 320 | |
| dc.source.endpage | 322 | |
| dc.source.issue | 5 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 25 | |
| dc.title | Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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