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Browsing by Author "Chabli, A."

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    Impact of surface preparation on the electrical characteristics of scanning spreading resistance microscopy

    Eyben, Pierre  
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    Clarysse, Trudo
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    Bogdanowicz, Janusz  
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    Janssens, Tom
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    Mariolle, D.
    ;
    Bertin, F.
    Meeting abstract
    2005, Proceedings of the 8th Int. Workshop on the Fabrication , Characterization and Modeling of Ultra Shallow Junctions in Semicond., 5/06/2005, p.119
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    Infrared interface analysis of high-k dielectrics deposited by atomic layer chemical vapour deposition

    Cosnier, Vincent
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    Bender, Hugo  
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    Caymax, Matty  
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    Chen, Jian
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    Conard, Thierry  
    ;
    Nohira, Hiroshi
    Proceedings paper
    2001, Extended Abstracts of the International Workshop on Gate Insulator - IWGI, 1/11/2001, p.226-229

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