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Browsing by Author "Chang, Ting -Yu"

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    Publication

    Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants

    Wang, Yu-Yun
    ;
    Wang, Kuan-Chi
    ;
    Chang, Ting -Yu
    ;
    Ronchi, Nicolo  
    ;
    O'Sullivan, Barry  
    ;
    Banerjee, Kaustuv  
    Journal article
    2022, MICROELECTRONICS RELIABILITY, 138, p.114680

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