Browsing by Author "Chen, Han-Ping"
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Publication A unified two-band model for oxide traps and interface states in MOS capacitors
Journal article2015, IEEE Transactions on Electron Devices, (62) 3, p.813-820Publication Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Journal article2014, Microelectronics Reliability, (54) 4, p.746-754