Publication:
Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1913 since deposited on 2021-10-22
Acq. date: 2025-12-13
Citations
Metrics
Views
1913 since deposited on 2021-10-22
Acq. date: 2025-12-13
Citations