Publication:
Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1920 since deposited on 2021-10-22
6last month
3last week
Acq. date: 2026-08-09
Citations
Statistics
Views
1920 since deposited on 2021-10-22
6last month
3last week
Acq. date: 2026-08-09
Citations