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Browsing by Author "Cheolgyu Kim, Cheolgyu"

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    Impact of fin height on bias temperature instability of memory periphery FinFETs

    Boubaaya, Mohamed  
    ;
    O'Sullivan, Barry  
    ;
    Franco, Jacopo  
    ;
    Dentoni Litta, Eugenio  
    Proceedings paper
    2019, 2019 IEEE International Integrated Reliability Workshop (IIRW), 13/10/2019, p.1-5

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