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Impact of fin height on bias temperature instability of memory periphery FinFETs
Publication:
Impact of fin height on bias temperature instability of memory periphery FinFETs
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boubaaya, Mohamed
;
O'Sullivan, Barry
;
Franco, Jacopo
;
Dentoni Litta, Eugenio
;
Ritzenthaler, Romain
;
Dupuy, Emmanuel
;
Machkaoutsan, Vladimir
;
Fazan, Pierre
;
Cheolgyu Kim, Cheolgyu
;
Spessot, Alessio
;
Linten, Dimitri
;
Horiguchi, Naoto
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1861
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-16
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Metrics
Views
1861
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-16
Citations