Publication:

Impact of fin height on bias temperature instability of memory periphery FinFETs

Date

2019
Proceedings Paper
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Author(s)

Boubaaya, Mohamed  
;
O'Sullivan, Barry  
;
Franco, Jacopo  
;
Dentoni Litta, Eugenio  
;
Ritzenthaler, Romain  
;
Dupuy, Emmanuel  
;
Machkaoutsan, Vladimir  
;
Fazan, Pierre  
;
Cheolgyu Kim, Cheolgyu
;
Spessot, Alessio  
;
Linten, Dimitri  
;
Horiguchi, Naoto  

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1864 since deposited on 2021-10-27
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Acq. date: 2026-05-17

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