Publication:

Impact of fin height on bias temperature instability of memory periphery FinFETs

Date

2019

Proceedings Paper

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Author(s)

Boubaaya, Mohamed

;

O'Sullivan, Barry

;

;

Dentoni Litta, Eugenio

;

Ritzenthaler, Romain

;

Dupuy, Emmanuel

;

Machkaoutsan, Vladimir

;

;

Cheolgyu Kim, Cheolgyu

;

Spessot, Alessio

;

Linten, Dimitri

;

Horiguchi, Naoto

Metrics

1861 since deposited on 2021-10-27

Acq. date: 2026-01-05