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Browsing by Author "Cherenev, Maksim"

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    On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

    Tyaginov, Stanislav  
    ;
    Afzalian, Aryan  
    ;
    Makarov, Alexander  
    ;
    Grill, Alexander
    Proceedings paper
    2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022

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