Publication:

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764568

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Author(s)

Tyaginov, Stanislav

;

Afzalian, Aryan

;

Makarov, Alexander

;

Grill, Alexander

;

Vandemaele, Michiel

;

Cherenev, Maksim

;

Vexler, Mikhail

;

Hellings, Geert

;

Journal

na

Metrics

1295 since deposited on 2023-02-27

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Acq. date: 2025-12-11