Publication:
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Afzalian, Aryan | |
| dc.contributor.author | Makarov, Alexander | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Cherenev, Maksim | |
| dc.contributor.author | Vexler, Mikhail | |
| dc.contributor.author | Hellings, Geert | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Afzalian, Aryan | |
| dc.contributor.imecauthor | Makarov, Alexander | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Hellings, Geert | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Afzalian, Aryan::0000-0002-5260-0281 | |
| dc.contributor.orcidimec | Makarov, Alexander::0000-0002-9927-6511 | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Tyaginov, Stanislav::0000-0002-5348-2096 | |
| dc.date.accessioned | 2023-06-08T09:19:36Z | |
| dc.date.available | 2023-02-27T03:28:36Z | |
| dc.date.available | 2023-06-08T09:19:36Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was supported by the Ministry of Science and Higher Education of the Russian Federation under Grant number 075-15-2020-790. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764568 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41185 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 9 | |
| dc.subject.keywords | INTERFACE DEFECTS | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | PASSIVATION | |
| dc.subject.keywords | SCATTERING | |
| dc.subject.keywords | HYDROGEN | |
| dc.subject.keywords | KINETICS | |
| dc.title | On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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