Browsing by Author "Cheung, K. P."
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Publication Quantitative yield and reliability projection from antenna test results - A case study
Proceedings paper2000, Symposium on VLSI Technology. Digest of Technical Papers, 13/06/2000, p.96-97Publication Stress-induced leakage current (SILC) and oxide breakdown: are they from the same oxide traps?
Publication The impact of plasma-charging damage on the RF performance of deep-submicron MOSFET
Journal article2002, IEEE Electron Device Letters, (23) 6, p.309-311Publication The impact of post breakdown gate leakage on MOSFET RF performance