Browsing by Author "Cheung, K.P."
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Different nature of process-induced and stress-induced defects in thin SiO2 layers
Publication Origin of microwave noise from an n-channel metal-oxide-semiconductor
Publication RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90nm RFCMOS
Proceedings paper2003-12, Technical Digest IEDM - International Electron Devices Meeting, 9/12/2003, p.181-184